Fast and accurate at-line elemental analysis
Built on the experience and success of the proven Epsilon 3 range of XRF spectrometers, the Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing XRF spectrometers.
Due to its low infrastructural requirements, Epsilon 4 can be placed next to the production line anywhere in your process. Its high performance enables most applications to be operated at ambient conditions, reducing costs for helium or vacuum maintenance.
Features
Flexible configurations
Epsilon 4 is a highly flexible analytical tool available in a 10-Watt version for elemental analysis (F – Am) in areas from R&D through to process control. For even higher sample throughput or extended light-element capabilities and in more challenging environments a 15-Watt version is available, which can even analyze carbon, nitrogen and oxygen.
Latest developments
Epsilon 4 instruments combine the latest excitation and detection technologies with state-of-the-art analysis software. The 15-Watt X-ray tube in combination with the high current (3 mA), latest silicon drift detector SDD30 together with the compact design of the optical path, deliver even better analytical performance than 50-Watt power EDXRF and even benchtop WDXRF systems - with the added bonus of power efficiency.
Fast and sensitive
Fast measurements are achieved by using the latest silicon drift detector technology that produces significantly higher intensities.
Unique detector electronics enable a linear count rate capacity to over 1,500,000 cps (at 50% dead time) and a count rate independent resolution typically better than 135 eV for better separation of analytical lines in the spectrum. This allows the Epsilon 4 spectrometer to run at full power and therefore realizes a much higher sample throughput compared to traditional EDXRF benchtop instruments.
Reduce helium consumption
The high performance of Epsilon 4 enables many applications to be operated in air atmosphere, without longer overhead time and costs involved for helium or maintenance of vacuum system. When measuring in air, low-energy X-ray photons characteristic of sodium, magnesium and aluminium, are sensitive to variations in air pressure and temperature. Built-in temperature and air-pressure sensors compensate for these environmental variations, ensuring excellent results whatever the weather.
Key specifications and options
| Sample handling | X-ray tube | Detector | Software |
|---|---|---|---|
| 10-position removable sample changer | Metal-ceramic side window for maximum stability | High-resolution silicon drift detector (SDD), typically 135 eV @ Mn-Kα | Elemental screening with Omnianstandardless analysis solution |
| Spectrometer can accommodate samples up to 52 mm (2 inch) in diameter | 50 micrometers thin beryllium window for high sensitivity for light elements (Na, Mg, Al, Si) | Max count rate of 1,500,000counts/s at 50% dead time | PASS/FAIL analysis with FingerPrintsolution |
| Spinner is included for better accuracy of air filter analysis | Ag anode X-ray tube for best performance of P, S and Cl analysis | Thin-entrance detector window for high sensitivity | Enhanced Data Security for regulated environments |
| Large sample mode for analyzing bigger samples up to 10 cm in height | Stratos for multi-layered samples | ||
| One flexible calibration for wear metals in fresh and used lubricating oils using Oil-Trace |
