Bruker D8 Advance powder X-ray diffraction (XRD) system

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SKU:
BA98797979
Condition:
Refurbished
Availability:
Out of stock
Shipping:
$650.00 (Fixed Shipping Cost)
Warranty:
1 year replacement Warranty. Details
Returns:
30 Days Money Back Guarantee. Details
$46,400.00

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The D8 operates with fully independent control of each axis which allows for rocking curve analysis as well as grazing incidence scans to be performed. 

 

 

The system includes:

  • Used Cu anode X-ray tube with minimum 70% intensity vs. new
  • Single sample stage
  • Full set of interchangeable aperture slits slits
  • Computer with original software (Windows based)
  • 2700 W Medium frequency high voltage generator
  • Integrated measuring electronics with scintillation detector
  • Fully Interlocked radiation housing
  • Manuals and schematics
  • 1-year warranty against component failure under normal use (Additional coverage may be included in the quotation if desired)

    The system may be configured to suit your needs with a wide variety of optional specialty attachments and software upgrades.

  • Diffracted beam monochromator
  • Digital phi stage (rotation controlled by stepper motor) 
  • Grazing incidence attachment (for thin films)
  • 9 position sample changer
  • New X-ray tubes of various x-ray tube target and focal types  
  • Theta/Theta goniometer or Theta/2Theta goniometer conversion
  • Closed loop water chillers
  • Automatic variable slits
  • High Temperature stage
  • KSA Energy dispersive detectorBruker LynxEye position sensitive detector (PSD)
    • Scan times reduced by 60-75%
    • Highest energy resolution available (~140eV)
    • Can be operated as an EDXRF detector for elemental analysis (optional software required)
    • Universal design
    • No need for battery backup, LNC or long warm-up delays

    Materials Data Inc. software upgrades are very popular options for full pattern analysis with plug-ins for many special functions. Upgraded software opens up the full potential of the D8:

Jade (Standard or Pro)

  • State-of-the-art pattern analysis software
  • Whole Pattern Fitting (WPF) (Rietveld) analysis
  • Search/Match qualitative phase analysis (requires pattern database)
  • Calibrated quantification
  • Pattern simulation
  • Available with single user or network licenses