ZEISS SIGMA Field Emission SEM for High Quality Imaging

ZEISS Sigma Family of FE-SEM – High Quality Imaging and Advanced Analytical Microscopy ZEISS Sigma family of field emission scanning electron microscopes combines high quality imaging, advanced analytical performance, and an excellent user experience. Structure your imaging and analysis routines and increase productivity with Sigma’s intuitive 4-step workflow. You’ll capture more data, faster than ever before. Choose from a variety of detector options to tailor Sigma precisely to your applications: you can image particles, surfaces, nanostructures, thin films, coatings and layers. With the Sigma family you enter the world of high-end imaging: Sigma 300 delivers excellence in price and performance while Sigma 500’s best-in-class EDS geometry delivers superb analytical performance. Count on accurate, reproducible results – from any sample, every time. • Flexible detection options to optimize signal acquisition • Workflow-based software for efficiency and ease • Combine with analytics including EDS, EBSD, and Raman