ZEISS Crossbeam Your FIB-SEM for High Throughput 3D Analysis

ZEISS Crossbeam combines the powerful imaging and analytical performance of a field emission scanning electron microscope (FE-SEM) with the superior processing ability of a next-generation focused ion beam (FIB). Crossbeam gives your 3D work that dynamic edge, whether you are milling, imaging or performing 3D analytics. Extract true sample information from your SEM images using Gemini electron optics. The Ion-sculptor FIB column introduces an altogether new way of FIB-processing. By minimizing sample damage you’ll maximize sample quality—and perform experiments faster at the same time. • When preparing TEM samples use the low voltage capabilities of the Ion-sculptor FIB: get ultrathin samples while keeping amorphization damage at a minimum. • Within the ZEISS Crossbeam Family, either exploit variable pressure on Crossbeam 350 or use Crossbeam 550 for your most demanding characterizations. • Enhance your in situ studies with Crossbeam laser: the LaserFIB workflow enables you to gain rapid access to deeply buried structures using the femtosecond laser