SiBrickScan Silicon Ingot Analyzer
Bruker introduces new SiBrickScan Silicon ingot analyzer. The new Bruker SiBrickScan (SBS) is the first commercially available FTIR at-line instrument allowing for the quantification of interstitial Oxygen in complete Silicon bricks and ingots. Since Silicon is by far the most important semiconductor material in electronics and photovoltaics, Bruker is proud to introduce the SBS system as a big step forward e.g. for Si wafer producers. In contrast to classical FTIR approaches SBS does not require the preparation of thin test samples but directly determines the Oxygen gradient along the ingot main axis and thus helps to implement fast and economic quality control.
