JSX-3100RII Energy-Dispersive X-Ray Fluorescence Spectrometer
X-ray Fluorescence Spectrometer equipped with high sensitivity,high resolution liquid nitrogen free Si (Li) semiconductor detector
- JSX-3100RII is an X-ray fluorescence spectrometer (XRF) equipped with a high-sensitivity, high-resolution, liquid nitrogen-free Si(Li) detector.
- JSX-3100RII equips unique refrigerating machine, which eliminate liquid nitrogen for measurements.
- JSX-3100RII equips the re-evacuating system for the X-ray detector, which achieves long-time stable operation.
- JSX-3100RII equips high-sensitive Si(Li)detector, short-path optical system, and specialized filters, which enables it to measure trace elements in short time.
- JSX-3100RII equips high-resolution SI(Li) detector, which enables it to separate the peaks of light elements such as Mg, Al and Si clearly.
- Quantitative analyses can be carried out without any standard substances by the FP method (fundamental parameter method)
- JSX-3100RII equips 1-mm diameter collimator and CCD camera as standard, which enables its users to observe and analyze small samples such as foreign substances.
- JSX-3100RII equips the sum-peak indication function as standard, which make it easy for its users to carry out qualitative analyses.
In addition, with the optional Sum-peak Removal Software, precision of the quantitative analysis can be improved.
The Thin Film FP method can analyze the thickness and composition of each layer in a multi-layer thin film samples such as composite plating, and alloy plating without standard samples.
The Thin Film FP method is equipped as standard.
